Beam displacement and blur caused by fast electron beam...

Ultramicroscopy 2020 / 04 Vol. 211

Beam displacement and blur caused by fast electron beam deflection

Zhang, Lixin, Garming, Mathijs W.H., Hoogenboom, Jacob P., Kruit, Pieter
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Volume:
211
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2019.112925
Date:
April, 2020
File:
PDF, 1.66 MB
2020
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