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Volume 211
Main
Ultramicroscopy
Volume 211
Ultramicroscopy
Volume 211
1
Beam displacement and blur caused by fast electron beam deflection
Zhang, Lixin
,
Garming, Mathijs W.H.
,
Hoogenboom, Jacob P.
,
Kruit, Pieter
Journal:
Ultramicroscopy
Year:
2020
File:
PDF, 1.66 MB
Your tags:
2020
2
A new approach for repeated tip-sample relocation for AFM imaging of nano and micro sized particles and cells in liquid environment
Abu Quba, Abd Alaziz
,
Schaumann, Gabriele E.
,
Karagulyan, Mariam
,
Diehl, Dörte
Journal:
Ultramicroscopy
Year:
2020
File:
PDF, 2.40 MB
Your tags:
2020
3
Selective growth of platinum nanolines by helium ion beam induced deposition and atomic layer deposition
Yang, Po-Shuan
,
Huang, Zheng-da
,
Huang, Kuei-Wen
,
Chen, Miin-Jang
Journal:
Ultramicroscopy
Year:
2020
File:
PDF, 1.79 MB
Your tags:
2020
4
Morphological analysis of 3d atom probe data using Minkowski functionals
Mason, Daniel R.
,
London, Andrew J.
Journal:
Ultramicroscopy
Year:
2020
File:
PDF, 10.18 MB
Your tags:
2020
5
Editorial Board
Journal:
Ultramicroscopy
Year:
2020
File:
PDF, 42 KB
Your tags:
2020
1
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