In situ investigation of atmospheric corrosion behavior of...

Microelectronics Reliability 2020 / 05 Vol. 108

In situ investigation of atmospheric corrosion behavior of copper under thin electrolyte layer and static magnetic field

Yu, Xueyong, Wang, Zehua, Lu, Zihan
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Volume:
108
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113630
Date:
May, 2020
File:
PDF, 3.01 MB
2020
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