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Volume 108
Main
Microelectronics Reliability
Volume 108
Microelectronics Reliability
Volume 108
1
In situ investigation of atmospheric corrosion behavior of copper under thin electrolyte layer and static magnetic field
Yu, Xueyong
,
Wang, Zehua
,
Lu, Zihan
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 3.01 MB
Your tags:
2020
2
Three-dimensional structure recognition of circuit patterns on semiconductor devices using multiple SEM images detected in different electron scattering angles
Yasui, Kenji
,
Osaki, Mayuka
,
Miyamoto, Atsushi
,
Namai, Hitoshi
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 2.87 MB
Your tags:
2020
3
Evaluation of thermal conductivity for sintered silver considering aging effect with microstructure based model
Qin, Fei
,
Hu, Yuankun
,
Dai, Yanwei
,
An, Tong
,
Chen, Pei
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 4.87 MB
Your tags:
2020
4
Effect of micromorphology on corrosion and mechanical properties of SAC305 lead-free solders
Chen, G.
,
Wang, X.H.
,
Yang, J.
,
Xu, W.L.
,
Lin, Q.
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 6.44 MB
Your tags:
2020
5
Two phase cooling with nano-fluid for highly dense electronic systems-on-chip â A pilot study
Bapu, B.R. Ramesh
,
Kayalvizhi, S.
,
Murugavalli, S.
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 1.48 MB
Your tags:
2020
6
Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors
Simicic, Marko
,
Ashif, Nowab Reza
,
Hellings, Geert
,
Chen, Shih-Hung
,
Nag, Manoj
,
Kronemeijer, Auke Jisk
,
Myny, Kris
,
Linten, Dimitri
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 2.02 MB
Your tags:
2020
7
Over-stress and under-stress effects in CDM testing
O'Sullivan, Greg
,
Smedes, Theo
,
Derikx, Richard
,
Garcia, Artemio
,
Knoppers, Bob
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 2.08 MB
Your tags:
2020
8
Change in trap characteristics during fatigue of Au/BiFeO3/SrRuO3
Jin, Lei
,
Zhu, Hui
,
Chu, Daping
,
Yang, Ying
,
Wang, Chen
,
Xie, Na
,
Huang, Zeng
,
Liu, Jiahui
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 2.16 MB
Your tags:
2020
9
Enhancing die level static fault isolation on power gated devices
Nagalingam, D.
,
Quah, A.C.T.
,
Moon, S.J.
,
Parab, S.M.
,
Ng, P.T.
,
Ting, S.L.
,
Ma, H.H.
,
Chen, C.Q.
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 4.00 MB
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2020
10
Editorial Board
Journal:
Microelectronics Reliability
Year:
2020
File:
PDF, 40 KB
Your tags:
2020
1
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