Over-stress and under-stress effects in CDM testing

Microelectronics Reliability 2020 / 05 Vol. 108

Over-stress and under-stress effects in CDM testing

O'Sullivan, Greg, Smedes, Theo, Derikx, Richard, Garcia, Artemio, Knoppers, Bob
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Volume:
108
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113625
Date:
May, 2020
File:
PDF, 2.08 MB
2020
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