Cell-Aware Defect Diagnosis of Customer Returns Based on...

IEEE Transactions on Device and Materials Reliability 2020 / 6 Vol. 20; Iss. 2

Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning

Mhamdi, Safa, Girard, Patrick, Virazel, Arnaud, Bosio, Alberto, Faehn, Eric, Ladhar, Aymen
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Volume:
20
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/TDMR.2020.2992482
Date:
June, 2020
File:
PDF, 1.41 MB
2020
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