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Volume 20; Issue 2
Main
IEEE Transactions on Device and Materials Reliability
Volume 20; Issue 2
IEEE Transactions on Device and Materials Reliability
Volume 20; Issue 2
1
Cell-Aware Defect Diagnosis of Customer Returns Based on Supervised Learning
Mhamdi, Safa
,
Girard, Patrick
,
Virazel, Arnaud
,
Bosio, Alberto
,
Faehn, Eric
,
Ladhar, Aymen
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 1.41 MB
Your tags:
2020
2
Demonstration of an Equivalent Material Approach for the Strain-Induced Reliability Estimation of Stacked-Chip Packaging
Lee, Chang-Chun
,
Huang, Pei-Chen
,
Lin, Yan-Cian
,
Chian, Bow-Tsin
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 1.58 MB
Your tags:
2020
3
Geometric Nonlinear Effect on Biaxial Bending Strength of Thin Silicon Die in the PoEF Test
Tsai, Ming-Yi
,
Yeh, Jia-Hao
,
Huang, Pu-Shan
,
Chen, D. L.
,
Shih, M. K.
,
Tarng, David
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 2.36 MB
Your tags:
2020
4
Energy Transformation Between the Inductor and the Power Transistor for the Unclamped Inductive Switching (UIS) Test
Nidhi, Karuna
,
Lee, Jian-Hsing
,
Huang, Shao-Chang
,
Ker, Ming-Dou
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 1.67 MB
Your tags:
2020
5
Stealthy Information Leakage Through Peripheral Exploitation in Modern Embedded Systems
Tychalas, Dimitrios
,
Keliris, Anastasis
,
Maniatakos, Michail
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 1.21 MB
Your tags:
2020
6
[Front cover]
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 564 KB
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2020
7
EditorialâRobust System Design IEEE IOLTS 2019
Gizopoulos, Dimitris
,
Alexandrescu, Dan
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 128 KB
Your tags:
2020
8
Guest Editorial IEEE International Integrated Reliability Workshop (IIRW) 2019
Tyaginov, Stanislav
,
Chbili, Zakariae
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 123 KB
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2020
9
Table of contents
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 477 KB
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2020
10
IEEE Transactions on Device and Materials Reliability information for authors
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 171 KB
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2020
11
Low temperature processing of electronic materials for cuttung edge devices
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 1.54 MB
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2020
12
Automated Die Inking
Xanthopoulos, Constantinos
,
Neckermann, Arnold
,
List, Paulus
,
Tschernay, Klaus-Peter
,
Sarson, Peter
,
Makris, Yiorgos
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 2.21 MB
Your tags:
2020
13
Run-Time Protection of Multi-Core Processors From Power-Noise Denial-of-Service Attacks
Tenentes, Vasileios
,
Das, Shidhartha
,
Rossi, Daniele
,
Al-Hashimi, Bashir M.
Journal:
IEEE Transactions on Device and Materials Reliability
Year:
2020
File:
PDF, 1.95 MB
Your tags:
2020
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