Enhancing die level static fault isolation on power gated devices
Nagalingam, D., Quah, A.C.T., Moon, S.J., Parab, S.M., Ng, P.T., Ting, S.L., Ma, H.H., Chen, C.Q.Volume:
108
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2020.113629
Date:
May, 2020
File:
PDF, 4.00 MB
2020