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Use of the modulating differentiation technique to study breakdown inhomogeneities in avalanche transit time silicon diode
R.V. Konakova, V.V. Rybalka, L.V. Scherbina, J.L. ZaitsevskiiVolume:
27
Year:
1984
Language:
english
Pages:
3
DOI:
10.1016/0038-1101(84)90172-2
File:
PDF, 305 KB
english, 1984