Reflectance anisotropy spectroscopy: a new method for...

Reflectance anisotropy spectroscopy: a new method for semiconductor surface chemistry investigation

V.L. Berkovits, D. Paget
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Volume:
233
Year:
1993
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(93)90051-p
File:
PDF, 403 KB
english, 1993
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