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Ex situ variable angle spectroscopic ellipsometry studies of electron cyclotron resonance etching of Hg1−xCdxTe
Glennis J. Orloff, John A. Woollam, Ping He, William A. McGahan, J.R. McNeil, R.D. Jacobson, Blaine JohsVolume:
233
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(93)90058-w
File:
PDF, 470 KB
english, 1993