Temperature dependence of the dielectric function of...

Temperature dependence of the dielectric function of silicon using in situ spectroscopic ellipsometry

G. Vuye, S. Fisson, V. Nguyen Van, Y. Wang, J. Rivory, F. Abelès
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Volume:
233
Year:
1993
Language:
english
Pages:
5
DOI:
10.1016/0040-6090(93)90082-z
File:
PDF, 461 KB
english, 1993
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