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High resolution Rutherford backscattering spectroscopy studies on Mo/Si multilayers
B. Heidemann, T. Tappe, B. Schmiedeskamp, U. HeinzmannVolume:
228
Year:
1993
Language:
english
Pages:
4
DOI:
10.1016/0040-6090(93)90564-6
File:
PDF, 356 KB
english, 1993