Organic film formation investigated by atomic force...

Thin Solid Films 1995 Vol. 264; Iss. 2

Organic film formation investigated by atomic force microscopy on the nanometre scale

T. Gesang, R. Höper, S. Dieckhoff, V. Schiett, W. Possart, O.-D. Hennemann
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Volume:
264
Year:
1995
Language:
english
Pages:
11
DOI:
10.1016/0040-6090(95)05846-x
File:
PDF, 1.31 MB
english, 1995
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