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Energy and time-resolved photoemission in a promising new approach for contactless integrated-circuit testing
H.K. Seitz, A. Blacha, R. Clauberg, H. BehaVolume:
5
Year:
1986
Language:
english
Pages:
7
DOI:
10.1016/0167-9317(86)90089-4
File:
PDF, 259 KB
english, 1986