![](/img/cover-not-exists.png)
Reliability of MOS devices with tungsten gates
F. Palumbo, S. Lombardo, J.H. Stathis, V. Narayanan, F.R. McFeely, J.J. YurkasVolume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2003.12.014
File:
PDF, 193 KB
english, 2004