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Modeling pFET currents after soft breakdown at different gate locations
B. Kaczer, A. De Keersgieter, R. Degraeve, F. Crupi, G. GroesenekenVolume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2003.12.027
File:
PDF, 245 KB
english, 2004