Influence of total-dose radiation on the electrical...

Microelectronic Engineering 2004 Vol. 72; Iss. 1-4

Influence of total-dose radiation on the electrical characteristics of SOI MOSFETs

J.A. Felix, J.R. Schwank, C.R. Cirba, R.D. Schrimpf, M.R. Shaneyfelt, D.M. Fleetwood, P.E. Dodd
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Volume:
72
Year:
2004
Language:
english
Pages:
10
DOI:
10.1016/j.mee.2004.01.013
File:
PDF, 503 KB
english, 2004
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