EEPROM memory stack with scaled down thickness

Microelectronic Engineering 2004 Vol. 72; Iss. 1-4

EEPROM memory stack with scaled down thickness

Ruth Shima Edelstein, Chris Cork, Efraim Aloni, Nachi Vofsy, Yakov Roizin
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Volume:
72
Year:
2004
Language:
english
Pages:
5
DOI:
10.1016/j.mee.2004.01.038
File:
PDF, 360 KB
english, 2004
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