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Topside release of atomic force microscopy probes with molded diamond tips
M. Fouchier, P. Eyben, G. Jamieson, W. VandervorstVolume:
78-79
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.mee.2004.12.011
File:
PDF, 249 KB
english, 2005