Electrical properties of MIS capacitor using low...

Electrical properties of MIS capacitor using low temperature electron beam gun—evaporated HfAlO dielectrics

V. Mikhelashvili, B. Meyler, J. Shneider, O. Kreinin, G. Eisenstein
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Volume:
45
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2004.11.022
File:
PDF, 225 KB
english, 2005
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