Physical fundamentals of external transient latch-up and...

Microelectronics Reliability 2006 Vol. 46; Iss. 5-6

Physical fundamentals of external transient latch-up and corrective actions

K. Domański, B. Półtorak, S. Bargstädt-Franke, W. Stadler, W. Bała
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Volume:
46
Year:
2006
Language:
english
Pages:
13
DOI:
10.1016/j.microrel.2005.10.007
File:
PDF, 1.04 MB
english, 2006
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