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Wear out failure mechanisms in aluminium and gold based LDMOS RF power applications
P.J. van der Wel, S.J.C.H. Theeuwen, J.A. Bielen, Y. Li, R.A. van den Heuvel, J.G. Gommans, F. van Rijs, P. Bron, H.J.F. PeuscherVolume:
46
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2006.02.011
File:
PDF, 282 KB
english, 2006