Comparative analysis of RF LDMOS capacitance reliability...

Microelectronics Reliability 2007 Vol. 47; Iss. 1

Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests

M.A. Belaïd, K. Ketata, M. Gares, K. Mourgues, M. Masmoudi, J. Marcon
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Volume:
47
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2006.04.009
File:
PDF, 622 KB
english, 2007
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