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Volume 47; Issue 1
Main
Microelectronics Reliability
Volume 47; Issue 1
Microelectronics Reliability
Volume 47; Issue 1
1
Silicon integrated photonics begins to revolutionize
Hei Wong
,
V. Filip
,
C.K. Wong
,
P.S. Chung
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 1.37 MB
Your tags:
english, 2007
2
Effects of TMF heating rates on damage accumulation and resultant mechanical behavior of Sn–Ag based solder joints
J.G. Lee
,
K.N. Subramanian
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 2.79 MB
Your tags:
english, 2007
3
N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis
C. Leyris
,
F. Martinez
,
A. Hoffmann
,
M. Valenza
,
J.C. Vildeuil
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 348 KB
Your tags:
english, 2007
4
Angle-resolved photoelectron spectroscopy on gate insulators
T. Hattori
,
H. Nohira
,
S. Shinagawa
,
M. Hori
,
M. Kase
,
T. Maruizumi
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 455 KB
Your tags:
english, 2007
5
Cyclic bending reliability of wafer-level chip-scale packages
Yi-Shao Lai
,
Tong Hong Wang
,
Han-Hui Tsai
,
Ming-Hwa R. Jen
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 962 KB
Your tags:
english, 2007
6
Computational modelling for reliable flip-chip packaging at sub-100 μm pitch using isotropic conductive adhesives
S. Stoyanov
,
R. Kay
,
C. Bailey
,
M. Desmulliez
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 622 KB
Your tags:
english, 2007
7
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation
Y. Fu
,
H. Wong
,
J.J. Liou
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 448 KB
Your tags:
english, 2007
8
Mi Lu, ,Arithmetic and Logic in Computer Systems (2004) John Wiley & Sons, Inc.,Hoboken, NJ 0-471-46945-9 Hardcover, pp. 246, plus XXII.
Mile Stojcev
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 76 KB
Your tags:
english, 2007
9
Modeling current transport in ultra-scaled field-effect transistors
V. Sverdlov
,
H. Kosina
,
S. Selberherr
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 268 KB
Your tags:
english, 2007
10
Overview on ESD protection design for mixed-voltage I/O interfaces with high-voltage-tolerant power-rail ESD clamp circuits in low-voltage thin-oxide CMOS technology
Ming-Dou Ker
,
Wei-Jen Chang
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 729 KB
Your tags:
english, 2007
11
Optimal design towards enhancement of board-level thermomechanical reliability of wafer-level chip-scale packages
Yi-Shao Lai
,
Tong Hong Wang
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 434 KB
Your tags:
english, 2007
12
The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth
Yuki Fukuda
,
Michael Osterman
,
Michael Pecht
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 186 KB
Your tags:
english, 2007
13
Test methodology for durability estimation of surface mount interconnects under drop testing conditions
J. Varghese
,
A. Dasgupta
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 1.54 MB
Your tags:
english, 2007
14
Single band electronic conduction in hafnium oxide prepared by atomic layer deposition
Sergey Shaimeev
,
Vladimir Gritsenko
,
Kaupo Kukli
,
Hei Wong
,
Eun-Hong Lee
,
Chungwoo Kim
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 193 KB
Your tags:
english, 2007
15
S.V. Nagaraj, Web Caching and its Applications, Kluwer Academic Publishers, Boston/Dordrecht/London, (The Kluwer International Series in Engineering and Computer Science, Vol. 772), Hardcover (May 1, 2004), $105.00, pp. 236, ISBN 1-4020-8049-2
Milorad Tosic
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 80 KB
Your tags:
english, 2007
16
Study of the electrical cycling stressed large area Schottky diodes using I–V and noise measurements
Milan M. Jevtić
,
Jovan M. Hadži-Vuković
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 232 KB
Your tags:
english, 2007
17
A review of the use of electro-thermal simulations for the analysis of heterostructure FETs
Giovanna Sozzi
,
Roberto Menozzi
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 287 KB
Your tags:
english, 2007
18
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests
M.A. Belaïd
,
K. Ketata
,
M. Gares
,
K. Mourgues
,
M. Masmoudi
,
J. Marcon
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 622 KB
Your tags:
english, 2007
19
Using neural networks as a fault detection mechanism in MEMS devices
Reza Asgary
,
Karim Mohammadi
,
Mark Zwolinski
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 665 KB
Your tags:
english, 2007
20
Sample tilting technique for preventing electrostatic discharge during high-current FIB gas-assisted etching with XeF2
Hirotaka Komoda
,
Chie Moritani
,
Kazutaka Takahashi
,
Heiji Watanabe
,
Kiyoshi Yasutake
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 448 KB
Your tags:
english, 2007
21
A voltage calibration technique of electro-optic probing for characterization internal to IC’s chip
Hongfei Liu
,
Alin Hou
,
Hongbo Zhang
,
Daming Zhang
,
Maobin Yi
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 202 KB
Your tags:
english, 2007
22
Reconfigurable digital controller for a buck converter based on FPGA
Miro Milanovic
,
Mitja Truntic
,
Primoz Slibar
,
Drago Dolinar
Journal:
Microelectronics Reliability
Year:
2007
Language:
english
File:
PDF, 337 KB
Your tags:
english, 2007
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