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Impact on the back gate degradation in partially depleted SOI n-MOSFETs by 2-MeV electron irradiation
K. Hayama, K. Takakura, K. Shigaki, H. Ohyama, J.M. Rafí, A. Mercha, E. Simoen, C. ClaeysVolume:
46
Year:
2006
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2006.07.063
File:
PDF, 299 KB
english, 2006