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Defect detection in multilayer ceramic capacitors
V. Krieger, W. Wondrak, A. Dehbi, W. Bartel, Y. Ousten, B. LevrierVolume:
46
Year:
2006
Language:
english
Pages:
6
DOI:
10.1016/j.microrel.2006.07.082
File:
PDF, 19.85 MB
english, 2006