Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage
D. Corso, S. Aurite, E. Sciacca, D. Naso, S. Lombardo, A. Santangelo, M.C. Nicotra, S. CascinoVolume:
47
Year:
2007
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2007.01.011
File:
PDF, 748 KB
english, 2007