Characterization of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed C–V technique
Giuseppina Puzzilli, Bogdan Govoreanu, Fernanda Irrera, Maarten Rosmeulen, Jan Van HoudtVolume:
47
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.microrel.2007.01.040
File:
PDF, 465 KB
english, 2007