PMOS breakdown effects on digital circuits – Modeling and analysis
Kuang, Weidong, Cao, Lizhi, Yu, C., Yuan, J.S.Volume:
48
Language:
english
Pages:
4
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.06.019
Date:
August, 2008
File:
PDF, 377 KB
english, 2008