Reliability investigations of 850nm silicon photodiodes...

Microelectronics Reliability 2008 / 8 Vol. 48; Iss. 8-9

Reliability investigations of 850nm silicon photodiodes under proton irradiation for space applications

Bourqui, M.L., Béchou, L., Gilard, O., Deshayes, Y., Vecchio, P. Del, How, L.S., Rosala, F., Ousten, Y., Touboul, A.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
48
Language:
english
Pages:
6
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.012
Date:
August, 2008
File:
PDF, 258 KB
english, 2008
Conversion to is in progress
Conversion to is failed