NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique
Aresu, S., Pufall, R., Goroll, M., Gustin, W.Volume:
48
Language:
english
Pages:
3
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2008.07.015
Date:
August, 2008
File:
PDF, 349 KB
english, 2008