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A percolation study of RTS noise amplitudes in nano-MOSFETs by Monte Carlo simulation
Ma Zhongfa, Zhang Peng, Wu Yong, Li Weihua, Zhuang Yiqi, Du LeiVolume:
50
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.microrel.2009.09.017
File:
PDF, 462 KB
english, 2010