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Thin film joining for high-temperature performance of power semi-conductor devices
Toshihide Takahashi, Shuichi Komatsu, Hiroshi Nishikawa, Tadashi TakemotoVolume:
50
Year:
2010
Language:
english
Pages:
8
DOI:
10.1016/j.microrel.2009.10.001
File:
PDF, 853 KB
english, 2010