High-resolution X-ray diffraction by end of range defects...

High-resolution X-ray diffraction by end of range defects in self-amorphized Ge

G. Bisognin, S. Vangelista, E. Bruno
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Volume:
154-155
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.mseb.2008.08.002
File:
PDF, 355 KB
english, 2008
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