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E center annealing in SiGe: Stability and charge states
K. Kuitunen, S. Kilpeläinen, J. Slotte, F. TuomistoVolume:
154-155
Year:
2008
Language:
english
Pages:
3
DOI:
10.1016/j.mseb.2008.08.006
File:
PDF, 236 KB
english, 2008