![](/img/cover-not-exists.png)
Comparative study of the fabricated and simulated Impact Ionization MOS (IMOS)
F. Mayer, C. Le Royer, G. Le Carval, C. Tabone, L. Clavelier, S. DeleonibusVolume:
51
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2007.02.015
File:
PDF, 392 KB
english, 2007