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Volume 51; Issue 4
Main
Solid-State Electronics
Volume 51; Issue 4
Solid-State Electronics
Volume 51; Issue 4
1
Impact of the dimensionality on the performance of tunneling FETs: Bulk versus one-dimensional devices
J. Knoch
,
S. Mantl
,
J. Appenzeller
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 394 KB
Your tags:
english, 2007
2
Capacitance measurements in nanometric silicon devices using Coulomb blockade
M. Hofheinz
,
X. Jehl
,
M. Sanquer
,
O. Cueto
,
G. Molas
,
M. Vinet
,
S. Deleonibus
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 449 KB
Your tags:
english, 2007
3
A perspective on today’s scaling challenges and possible future directions
Robert H. Dennard
,
Jin Cai
,
Arvind Kumar
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 365 KB
Your tags:
english, 2007
4
Investigation of MOS capacitors and SOI–MOSFETs with epitaxial gadolinium oxide (Gd2O3) and titanium nitride (TiN) electrodes
T. Echtermeyer
,
H.D.B. Gottlob
,
T. Wahlbrink
,
T. Mollenhauer
,
M. Schmidt
,
J.K. Efavi
,
M.C. Lemme
,
H. Kurz
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 188 KB
Your tags:
english, 2007
5
Device performance and optimization of decananometer long double gate MOSFET by Monte Carlo simulation
A. Bournel
,
V. Aubry-Fortuna
,
J. Saint-Martin
,
P. Dollfus
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 325 KB
Your tags:
english, 2007
6
Impact of the gate-electrode/dielectric interface on the low-frequency noise of thin gate oxide n-channel metal-oxide-semiconductor field-effect transistors
C. Claeys
,
E. Simoen
,
P. Srinivasan
,
D. Misra
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 621 KB
Your tags:
english, 2007
7
Extraction of the gate capacitance coupling coefficient in floating gate non-volatile memories: Statistical study of the effect of mismatching between floating gate memory and reference transistor in dummy cell extraction methods
Quentin Rafhay
,
M. Florian Beug
,
Russell Duane
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 319 KB
Your tags:
english, 2007
8
Experimental determination of the channel backscattering coefficient on 10–70 nm-metal-gate Double-Gate transistors
Vincent Barral
,
T. Poiroux
,
M. Vinet
,
J. Widiez
,
B. Previtali
,
P. Grosgeorges
,
G. Le Carval
,
S. Barraud
,
J.L. Autran
,
D. Munteanu
,
S. Deleonibus
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 380 KB
Your tags:
english, 2007
9
Combined sources of intrinsic parameter fluctuations in sub-25 nm generation UTB-SOI MOSFETs: A statistical simulation study
K. Samsudin
,
F. Adamu-Lema
,
A.R. Brown
,
S. Roy
,
A. Asenov
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 647 KB
Your tags:
english, 2007
10
Monte-Carlo analysis of signal propagation delay and AC performance of decananometric bulk and double-gate MOSFETs
N. Barin
,
P. Palestri
,
C. Fiegna
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 299 KB
Your tags:
english, 2007
11
Phonon scattering in Si-based nanodevices
L. Donetti
,
F. Gámiz
,
N. Rodriguez
,
F.G. Ruiz
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 472 KB
Your tags:
english, 2007
12
Editorial Board
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 78 KB
Your tags:
english, 2007
13
Impact of fin width on digital and analog performances of n-FinFETs
V. Subramanian
,
A. Mercha
,
B. Parvais
,
J. Loo
,
C. Gustin
,
M. Dehan
,
N. Collaert
,
M. Jurczak
,
G. Groeseneken
,
W. Sansen
,
S. Decoutere
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 1010 KB
Your tags:
english, 2007
14
Foreword
Simon Deleonibus
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 65 KB
Your tags:
english, 2007
15
A new analytical model for the energy dispersion in two-dimensional hole inversion layers
Marco De Michielis
,
David Esseni
,
Pierpaolo Palestri
,
Luca Selmi
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 245 KB
Your tags:
english, 2007
16
Low frequency noise in biaxially strained silicon n-MOSFETs with ultrathin gate oxides
Thierry Contaret
,
Touati Boutchacha
,
Gérard Ghibaudo
,
Frédéric Bœuf
,
Thomas Skotnicki
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 599 KB
Your tags:
english, 2007
17
CMOS 6-T SRAM cell design subject to “atomistic” fluctuations
B. Cheng
,
S. Roy
,
A. Asenov
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 1.61 MB
Your tags:
english, 2007
18
Comparative study of the fabricated and simulated Impact Ionization MOS (IMOS)
F. Mayer
,
C. Le Royer
,
G. Le Carval
,
C. Tabone
,
L. Clavelier
,
S. Deleonibus
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 392 KB
Your tags:
english, 2007
19
Device structures and carrier transport properties of advanced CMOS using high mobility channels
S. Takagi
,
T. Tezuka
,
T. Irisawa
,
S. Nakaharai
,
T. Numata
,
K. Usuda
,
N. Sugiyama
,
M. Shichijo
,
R. Nakane
,
S. Sugahara
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 1.18 MB
Your tags:
english, 2007
20
Navigation aids in the search for future high-k dielectrics: Physical and electrical trends
O. Engström
,
B. Raeissi
,
S. Hall
,
O. Buiu
,
M.C. Lemme
,
H.D.B. Gottlob
,
P.K. Hurley
,
K. Cherkaoui
Journal:
Solid-State Electronics
Year:
2007
Language:
english
File:
PDF, 229 KB
Your tags:
english, 2007
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