Investigation of deep level defects in copper irradiated bipolar junction transistor
K.V. Madhu, Ravi Kumar, M. Ravindra, R. DamleVolume:
52
Year:
2008
Language:
english
Pages:
7
DOI:
10.1016/j.sse.2008.06.001
File:
PDF, 443 KB
english, 2008