RF characterization and isolation properties of mesoporous Si by on-chip coplanar waveguide measurements
H. Contopanagos, F. Zacharatos, A.G. NassiopoulouVolume:
52
Year:
2008
Language:
english
Pages:
5
DOI:
10.1016/j.sse.2008.06.044
File:
PDF, 439 KB
english, 2008