Comparison of contact resistance between accumulation-mode and inversion-mode multigate FETs
Chi-Woo Lee, Dimitri Lederer, Aryan Afzalian, Ran Yan, Nima Dehdashti, Weize Xiong, Jean-Pierre ColingeVolume:
52
Year:
2008
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2008.09.006
File:
PDF, 366 KB
english, 2008