Modeling short-channel effects in channel thermal noise and...

Solid-State Electronics 2009 Vol. 53; Iss. 1

Modeling short-channel effects in channel thermal noise and induced-gate noise in MOSFETs in the NQS regime

Sunil Vallur, R.P. Jindal
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Volume:
53
Year:
2009
Language:
english
Pages:
6
DOI:
10.1016/j.sse.2008.09.015
File:
PDF, 244 KB
english, 2009
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