Low-voltage cross-sectional EBIC for characterisation of...

Ultramicroscopy 2007 Vol. 107; Iss. 4-5

Low-voltage cross-sectional EBIC for characterisation of GaN-based light emitting devices

Grigore Moldovan, Payam Kazemian, Paul R. Edwards, Vincent K.S. Ong, Oka Kurniawan, Colin J. Humphreys
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Volume:
107
Year:
2007
Language:
english
Pages:
8
DOI:
10.1016/j.ultramic.2006.10.002
File:
PDF, 780 KB
english, 2007
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