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Optimized conditions for imaging the effects of bonding charge density in electron microscopy
J. Ciston, J.S. Kim, S.J. Haigh, A.I. Kirkland, L.D. MarksVolume:
111
Year:
2011
Language:
english
Pages:
11
DOI:
10.1016/j.ultramic.2010.12.003
File:
PDF, 2.23 MB
english, 2011