Ultramicroscopy

1

Experimental and theoretical study of electron density and structure factors in CoSb3

R. Sæterli, E. Flage-Larsen, J. Friis, O.M. Løvvik, J. Pacaud, K. Marthinsen, R. Holmestad

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 634 KB

english, 2011

2

Bloch wave symmetries in electron diffraction: Applications to Friedels law, Gjonnes–Moodie lines and refraction at interfaces

K. Valset, J. Tafto

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 630 KB

english, 2011

3

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

H. Inada, D. Su, R.F. Egerton, M. Konno, L. Wu, J. Ciston, J. Wall, Y. Zhu

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 3.20 MB

english, 2011

4

Practical implementation of a direct method for coherent diffractive imaging

A.V. Martin, A.I. Bishop, D.M. Paganin, L.J. Allen

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 602 KB

english, 2011

5

Should it be ‘picoscopy’?

P.W. Hawkes

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 235 KB

english, 2011

6

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Peng Wang, Gavin Behan, Angus I. Kirkland, Peter D. Nellist, Eireann C. Cosgriff, Adrian J. D’Alfonso, Andrew J. Morgan, Leslie J. Allen, Ayako Hashimoto, Masaki Takeguchi, Kazutaka Mitsuishi, Masayuk

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 1.41 MB

english, 2011

7

Combining real and reciprocal space information for aberration free coherent electron diffractive imaging

Jian-Min Zuo, Jiong Zhang, Weijie Huang, Ke Ran, Bin Jiang

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 792 KB

english, 2011

8

Compressive auto-indexing in femtosecond nanocrystallography

Filipe R.N.C. Maia, Chao Yang, Stefano Marchesini

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 384 KB

english, 2011

9

Beyond the crystallization paradigm: Structure determination from diffraction patterns from ensembles of randomly oriented particles

H.C. Poon, D.K. Saldin

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 1.03 MB

english, 2011

10

Throughput maximization of particle radius measurements through balancing size versus current of the electron probe

W. Van den Broek, S. Van Aert, P. Goos, D. Van Dyck

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 279 KB

english, 2011

11

Aberration-compensated large-angle rocking-beam electron diffraction

Christoph T. Koch

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 1.83 MB

english, 2011

12

Persistent misconceptions about incoherence in electron microscopy

D. Van Dyck

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 355 KB

english, 2011

13

REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns

J. Barthel, A. Thust

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 2.13 MB

english, 2011

14

Mask-assisted deterministic phase–amplitude retrieval from a single far-field intensity diffraction pattern: Two experimental proofs of principle using visible light

Sergey G. Podorov, Alexis I. Bishop, David M. Paganin, Konstantin M. Pavlov

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 760 KB

english, 2011

15

Applying an information transmission approach to extract valence electron information from reconstructed exit waves

Qiang Xu, Henny W. Zandbergen, Dirk Van Dyck

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 748 KB

english, 2011

16

A holographic biprism as a perfect energy filter?

Jo Verbeeck, Giovanni Bertoni, Hannes Lichte

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 480 KB

english, 2011

17

Fabrication and electric measurements of nanostructures inside transmission electron microscope

Qing Chen, Lian-Mao Peng

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 1.15 MB

english, 2011

18

A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns

Philip N.H. Nakashima, Alexander F. Moodie, Joanne Etheridge

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 1.09 MB

english, 2011

19

Introduction to the special issue in honor of Regents' Prof. John C.H. Spence in occasion of his 65th birthday

Christoph T. Koch, Jian-Min Zuo, Henry Chapman

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 160 KB

english, 2011

20

IFC (Editorial Board)

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 78 KB

english, 2011

21

J. Spence's 65th birthday

Christoph Koch, Jian-Min Zuo, Henry Chapman

Journal:

Ultramicroscopy

Year:

2011

File:

PDF, 20 KB

2011

22

Mechanisms of decoherence in electron microscopy

A. Howie

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 350 KB

english, 2011

24

Construction of an organic crystal structural model based on combined electron and powder X-ray diffraction data and the charge flipping algorithm

Jinsong Wu, Yong Sheng Zhao, Hefei Hu, Jiaxing Huang, Jian-Min Zuo, Vinayak P. Dravid

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 749 KB

english, 2011

25

Strategies for processing diffraction data from randomly oriented particles

Veit Elser

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 177 KB

english, 2011

26

In situ EELS study of dehydration of Al(OH)3 by electron beam irradiation

Nan Jiang, John C.H. Spence

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 550 KB

english, 2011

27

Revisiting Bragg's X-ray microscope: Scatter based optical transient grating detection of pulsed ionising radiation

Wilfred K. Fullagar, David M. Paganin, Chris J. Hall

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 265 KB

english, 2011

28

Towards ETEM serial crystallography: Electron diffraction from liquid jets

D.P. Deponte, J.T. Mckeown, U. Weierstall, R.B. Doak, J.C.H. Spence

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 360 KB

english, 2011

29

Optimized conditions for imaging the effects of bonding charge density in electron microscopy

J. Ciston, J.S. Kim, S.J. Haigh, A.I. Kirkland, L.D. Marks

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 2.23 MB

english, 2011

30

Theoretical estimation for correlations of diffraction patterns from objects differently oriented in space

B. Ziaja, A.V. Martin, F. Wang, H.N. Chapman, E. Weckert

Journal:

Ultramicroscopy

Year:

2011

Language:

english

File:

PDF, 283 KB

english, 2011

Volume 111; Issue 7

Experimental and theoretical study of electron density and structure factors in CoSb3

Bloch wave symmetries in electron diffraction: Applications to Friedels law, Gjonnes–Moodie lines and refraction at interfaces

Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

Practical implementation of a direct method for coherent diffractive imaging

Should it be ‘picoscopy’?

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope

Combining real and reciprocal space information for aberration free coherent electron diffractive imaging

Compressive auto-indexing in femtosecond nanocrystallography

Beyond the crystallization paradigm: Structure determination from diffraction patterns from ensembles of randomly oriented particles

Throughput maximization of particle radius measurements through balancing size versus current of the electron probe

Aberration-compensated large-angle rocking-beam electron diffraction

Persistent misconceptions about incoherence in electron microscopy

REPRINT OF: Aberration measurement in HRTEM: Implementation and diagnostic use of numerical procedures for the highly precise recognition of diffractogram patterns

Mask-assisted deterministic phase–amplitude retrieval from a single far-field intensity diffraction pattern: Two experimental proofs of principle using visible light

Applying an information transmission approach to extract valence electron information from reconstructed exit waves

A holographic biprism as a perfect energy filter?

Fabrication and electric measurements of nanostructures inside transmission electron microscope

A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns

Introduction to the special issue in honor of Regents' Prof. John C.H. Spence in occasion of his 65th birthday

IFC (Editorial Board)

J. Spence's 65th birthday

Contents

Mechanisms of decoherence in electron microscopy

Construction of an organic crystal structural model based on combined electron and powder X-ray diffraction data and the charge flipping algorithm

Strategies for processing diffraction data from randomly oriented particles

In situ EELS study of dehydration of Al(OH)3 by electron beam irradiation

Revisiting Bragg's X-ray microscope: Scatter based optical transient grating detection of pulsed ionising radiation

Towards ETEM serial crystallography: Electron diffraction from liquid jets

Optimized conditions for imaging the effects of bonding charge density in electron microscopy

Theoretical estimation for correlations of diffraction patterns from objects differently oriented in space