Influence of device geometry on SOI single-hole transistor...

Microelectronics Reliability 2001 Vol. 41; Iss. 11

Influence of device geometry on SOI single-hole transistor characteristics

X Tang, X Baie, J.P Colinge, P Loumaye, C Renaux, V Bayot
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Volume:
41
Year:
2001
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(01)00044-0
File:
PDF, 796 KB
english, 2001
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