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Volume 41; Issue 11
Main
Microelectronics Reliability
Volume 41; Issue 11
Microelectronics Reliability
Volume 41; Issue 11
1
Novel fully silicided ballasting and MFT design techniques for ESD protection in advanced deep sub-micron CMOS technologies
Koen G Verhaege
,
Christian C Russ
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 747 KB
Your tags:
english, 2001
2
Advanced 2D/3D ESD device simulation – a powerful tool already used in a pre-Si phase
K Esmark
,
W Stadler
,
M Wendel
,
H Goßner
,
X Guggenmos
,
W Fichtner
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 824 KB
Your tags:
english, 2001
3
Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions
J Wu
,
P Juliano
,
E Rosenbaum
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 197 KB
Your tags:
english, 2001
4
Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits
Yu Wang
,
Patrick Juliano
,
Sopan Joshi
,
Elyse Rosenbaum
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 492 KB
Your tags:
english, 2001
5
The importance of standardizing CDM ESD test head parameters to obtain data correlation
Leo G. Henry
,
Mark A. Kelly
,
Tom Diep
,
Jon Barth
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 707 KB
Your tags:
english, 2001
6
Distributed control based on distributed electronic circuits: application to vibration control
Mahamane Kader
,
Michel Lenczner
,
Zeljko Mrcarica
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 3.65 MB
Your tags:
english, 2001
7
Study of the self-alignment of no-flow underfill for micro-BGA assembly
Y.C Chan
,
P.L Tu
,
K.C Hung
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 1.16 MB
Your tags:
english, 2001
8
Effects of thermomechanical cycling on lead and lead-free (SnPb and SnAgCu) surface mount solder joints
F.A. Stam
,
E. Davitt
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 692 KB
Your tags:
english, 2001
9
A method of thermal testing of microsystems
Piotr Bratek
,
Andrzej Kos
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 1.09 MB
Your tags:
english, 2001
10
Lead-free plastic area array BGAs and polymer stud grid arraysTM package reliability
Dominique Wojciechowski
,
Moses Chan
,
Fabrizio Martone
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 837 KB
Your tags:
english, 2001
11
Impact of interface nature on deep sub-micron Al-plug resistance
Bing-Yue Tsui
,
Tsung-Ju Yang
,
Tzu-Kun Ku
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 872 KB
Your tags:
english, 2001
12
Tools for contactless testing and simulation of CMOS circuits
F Stellari
,
F Zappa
,
S Cova
,
L Vendrame
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 537 KB
Your tags:
english, 2001
13
On the InGaP/InxGa1−xAs pseudomorphic high electron-mobility transistors for high-temperature operations
Kun-Wei Lin
,
Kuo-Hui Yu
,
Wen-Lung Chang
,
Chih-Kai Wang
,
Wen-Huei Chiou
,
Wen-Chau Liu
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 266 KB
Your tags:
english, 2001
14
Effect of SiO2/Si interface roughness on gate current
Ling-Feng Mao
,
Yao Yang
,
Jian-Lin Wei
,
Heqiu Zhang
,
Ming-Zhen Xu
,
Chang-Hua Tan
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 286 KB
Your tags:
english, 2001
15
An assessment of the value of added screening of electronic components for commercial aerospace applications
Kendall D Hester
,
Matthew P Koehler
,
Hanna Kanciak-Chwialkowski
,
Brian H Jones
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 123 KB
Your tags:
english, 2001
16
A new lifetime prediction method for hot-carrier degradation in n-MOSFETs with ultrathin gate oxides under Vg=Vd
Fuchen Mu
,
Mingzhen Xu
,
Changhua Tan
,
Xiaorong Duan
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 94 KB
Your tags:
english, 2001
17
Foreword – On-Chip ESD
Markus P.J Mergens
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 24 KB
Your tags:
english, 2001
18
Layout and bias options for maximizing Vt1 in cascoded NMOS output buffers
James W. Miller
,
Michael G. Khazhinsky
,
James C. Weldon
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 330 KB
Your tags:
english, 2001
19
Influence of device geometry on SOI single-hole transistor characteristics
X Tang
,
X Baie
,
J.P Colinge
,
P Loumaye
,
C Renaux
,
V Bayot
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 796 KB
Your tags:
english, 2001
20
Electrical degradation and recovery of dielectrics in n++-poly-Si/SiOx/SiO2/p-sub structures designed for application in low-voltage non-volatile memories
Fernanda Irrera
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 152 KB
Your tags:
english, 2001
21
The development of poled polyimide dielectric layers for simultaneous testing and light guiding applications in MCM-Ds
D.M Mechtel
,
H.K Charles Jr
,
A.S Francomacaro
Journal:
Microelectronics Reliability
Year:
2001
Language:
english
File:
PDF, 299 KB
Your tags:
english, 2001
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