Static and low frequency noise characterization of surface-...

Microelectronics Reliability 2002 Vol. 42; Iss. 1

Static and low frequency noise characterization of surface- and buried-mode 0.1 μm P and N MOSFETs

M Fadlallah, G Ghibaudo, J Jomaah, M Zoaeter, G Guegan
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Volume:
42
Year:
2002
Language:
english
Pages:
6
DOI:
10.1016/s0026-2714(01)00232-3
File:
PDF, 393 KB
english, 2002
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