Significance of the failure criterion on transmission line...

Microelectronics Reliability 2002 Vol. 42; Iss. 6

Significance of the failure criterion on transmission line pulse testing

B. Keppens, V. De Heyn, M. Natarajan Iyer, V. Vassilev, G. Groeseneken
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Volume:
42
Year:
2002
Language:
english
Pages:
7
DOI:
10.1016/s0026-2714(02)00053-7
File:
PDF, 512 KB
english, 2002
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