Electron traps created in gate oxides by Fowler–Nordheim injections
G. Auriel, J. Oualid, D. VuillaumeVolume:
38
Year:
1998
Language:
english
Pages:
5
DOI:
10.1016/s0026-2714(97)00035-8
File:
PDF, 142 KB
english, 1998